TY  - GEN
T1  - Multi-label dimensionality reduction
T2  - Chapman & Hall/CRC machine learning & pattern recognition series
A1  - Liang Sun.
A2  - Ji, Shuiwang.
A2  - Ye, Jieping.
LA  - English
PP  - Boca Raton, Florida
PB  - CRC Press
YR  - 2014
UL  - https://colectivo.uloyola.es/Record/ELB140769
OP  - 206
CN  - Q325.5 .L52 2014
SN  - 9781439806166 (e-book)
KW  - Computational complexity.
KW  - Machine learning.
KW  - Pattern perception.
KW  - Electronic books.
ER  -