Operational risk management a practical approach to intelligent data analysis - Kenett, Ron.; Raanan, Yossi (Chichester ; [Hoboken] : John Wiley & Sons, 2010)
Includes bibliographical references and index.
Description based on metadata supplied by the publisher and other sources.
Electronic reproduction. Santa Fe, Arg.: elibro, 2022. Available via World Wide Web. Access may be limited to eLibro affiliated libraries.
Keywords: Risk management; Quality control; Information technology -- Quality control; Process control; Electronic books