Analyzing materials using joint x-ray fluorescence and diffraction spectra /
Main Author: | Mikhailov, Igor F., |
---|---|
Other Authors: | Baturin, Alexey A.,, Mikhailov, Anton I., |
Format: | eBook |
Language: | English |
Published: |
Newcastle-upon-Tyne, England :
Cambridge Scholars Publishing,
2020.
|
Subjects: | |
Online Access: | https://recursos.uloyola.es/login?url=https://accedys.uloyola.es:8443/accedix0/sitios/ebook.php?id=125260 |
Similar Items
-
Diffuse x-ray scattering and models of disorder
by: Welberry, T. R.
Published: (2004) -
X-ray photoelectron spectroscopy an introduction to principles and practices /
by: Van der Heide, Paul, 1962-
Published: (2012) -
Structure from diffraction methods /
Published: (2014) -
Manual de radioscopia /
by: Mora Chamorro, Héctor.
Published: (2013) -
Man Ray : luces, cámara, revolución /
by: Puyol Loscertales, Ana,
Published: (2019)