Semiconductor laser engineering, reliability and diagnostics a practical approach to high power and single mode devices /
"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the sam...
| Autor principal: | |
|---|---|
| Formato: | Electrónico |
| Idioma: | English |
| Fecha de publicación: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2013.
|
| Materias: | |
| Acceso en línea: | https://recursos.uloyola.es/login?url=https://accedys.uloyola.es:8443/accedix0/sitios/ebook.php?id=178093 |