Interferometría por corrimiento de fase para caracterizar materiales electro-ópticos

Bibliographic Details
Main Author: Rueda P., J. E.
Other Authors: Lasprilla, M. C., e-libro, Corp.
Format: Analítica
Language:Spanish
Published: Pamplona, Colombia : Universidad de Pamplona, 2006.
Subjects:
Online Access:https://recursos.uloyola.es/login?url=https://accedys.uloyola.es:8443/accedix0/sitios/ebook.php?id=5429
Description
Published:Vol. 4, No. 1(2006)-
Physical Description:10-16 p.
Publication Frequency:Semestral
ISSN:0120-4211