Hosmer, D. W., Sturdivant, R. X., & Lemeshow, S. (2013). Applied Logistic Regression (3rd ed.). New York: Wiley.
Citación estilo ChicagoHosmer, David W., Rodney X. Sturdivant, and Stanley Lemeshow. Applied Logistic Regression. 3rd ed. New York: Wiley, 2013.
Cita MLAHosmer, David W., Rodney X. Sturdivant, and Stanley Lemeshow. Applied Logistic Regression. 3rd ed. New York: Wiley, 2013.
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