Statistical regression with measurement error / Chi-Lun Cheng, John W. Van Ness

Main Author: Cheng, Chi-Lun
Other Authors: Van Ness, John W
Format: Book
Publication: New York : Oxford University Press, 1999London [etc.] : Arnold, 1999
Physical Description: XIV, 262 p. ; 23 cm
Clasificación CDU: * 519.2
519.2
Collection: Kendall's library of statistics 6
Subjects:
ISBN: 0340549378

Sevilla - Almacén

Holdings details from Sevilla - Almacén
Copy 66670 Available